ZEISS Xradia

Expand the boundaries of your non-destructive sub-micron scale imaging built on industry-best resolution and contrast.

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ZEISS X-ray Tomography Solutions

High Resolution 3D X-ray Microscopy and Computed Tomography

  • Characterize the properties and behaviors of your materials non-destructively.
  • Reveal details of microstructures in three dimensions (3D).
  • Develop and confirm models or visualize structural details.
  • Achieve high contrast and submicron resolution imaging even for relatively large samples.

Xradia Versa

The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes, and push spatial resolution down to 500 nm with minimum achievable voxels of <40 nm.

Xradia Ultra

The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50 nm and minimum achievable voxels of 16nm.

Xradia Context microCT

ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system with a robust stage and flexible software-controlled source/detector positioning.

Xradia CrystalCT

Uniquely augments the powerful technique of computed tomography with the ability to reveal crystallographic grain microstructures, transforming the way polycrystalline materials can be studied.

Industrial Computed Tomography

Industrial computed tomography (CT) gives you entirely new insights by making it possible to capture the volume of all internal structures in next to no time. ZEISS is a pioneer in fast CT and enables the complete volume-based inspection of components during the production cycle.